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Origin of the Electroluminescence from Annealed-ZnO/GaN Heterojunction Light-Emitting Diodes

机译:退火的ZnO / GaN异质结发光二极管的电致发光起源

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摘要

This paper addressed the effect of post-annealed treatment on the electroluminescence (EL) of an n-ZnO/p-GaN heterojunction light-emitting diode (LED). The bluish light emitted from the 450 °C-annealed LED became reddish as the LED annealed at a temperature of 800 °C under vacuum atmosphere. The origins of the light emission for these LEDs annealed at various temperatures were studied using measurements of electrical property, photoluminescence, and Auger electron spectroscopy (AES) depth profiles. A blue-violet emission located at 430 nm was associated with intrinsic transitions between the bandgap of n-ZnO and p-GaN, the green-yellow emission at 550 nm mainly originating from the deep-level transitions of native defects in the n-ZnO and p-GaN surfaces, and the red emission at 610 nm emerging from the Ga-O interlayer due to interdiffusion at the n-ZnO/p-GaN interface. The above-mentioned emissions also supported the EL spectra of LEDs annealed at 700 °C under air, nitrogen, and oxygen atmospheres, respectively.
机译:本文讨论了后退火处理对n-ZnO / p-GaN异质结发光二极管(LED)的电致发光(EL)的影响。当在真空气氛下在800°C的温度下退火时,从经过450°C退火的LED发出的蓝光变成微红色。使用电性能,光致发光和俄歇电子能谱(AES)深度分布的测量研究了在各种温度下退火的这些LED的发光起源。位于430 nm处的蓝紫色发射与n-ZnO和p-GaN的带隙之间的固有跃迁相关联,550 nm处的绿黄色发射主要源自n-ZnO中固有缺陷的深层跃迁。由于在n-ZnO / p-GaN界面处的相互扩散,Ga-O夹层出现了610 nm的红色发射。上述辐射还支持分别在空气,氮气和氧气气氛下于700°C退火的LED的EL光谱。

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