高过载存储测试中抗过载技术的研究

摘要

介绍了高过载存储测试的系统组成和设计原理.对记录器抗高过载能力进行理论分析和试验证明,从电路和结构设计方面考虑提高抗高过载能力.应用ANSYS软件对结构进行仿真,并采用缓冲和灌封技术相结合的方案,使得防护效果更佳.经过试验证明:这种方案具有很高的可靠性.%The constitute and design theory of high over-loaded storage testing system are introduced. Theoretic analysis and experiment prove to the anti-high over-loaded capacity of recorder, the anti-high over-loaded capacity in circuit and structure design is improved. Structure simulation is made by ANSYS and combined cushioning with envelop. Examination shows that the way has high reliability.