X射线荧光光谱法测定生铁中10种元素

摘要

Ten elements including C, Si,Mn, P, S, Ti, V, Cr, Ni, Cu in cast iron were determined by wavelength dispersive X-ray fluorescence spectrometer. Crystal OVO-C was selected for measuring C,and the obtained intensity was higher than that measured by crystal OVO-55. The influence of the whiting level of sample on the determination results was tested. The whiting and whiting level of sample surface influences the results of C,Si,P and S obviously, but has little effect on the results of Mn.The detection limit was 1. 2-114 μg/g. The precision test indicated that the relative standard deviation (RSD, n = 11) of C, Si, Mn, P and S , which were hardly simultaneously analyzed, were 0. 57 ％ , 1. 3％ ,0. 53％,0. 98％ and 1. 2％. The method has been applied for the determination of 10 elements in cast iron samples,the results were consistent with those obtained by other methods.%采用波长色散X射线荧光光谱仪测定生铁中碳、硅、锰、磷、硫、钛、钒、铬、镍、铜等10个元素的含量.选择晶格面间距宽的晶体,其X射线荧光信号明显增强.试验了试样白口化对测量结果的影响,发现试样表面白口化与否和白口化的程度明显影响碳、硅、磷、硫等元素的测量结果,但对锰的影响很小.方法的检出限为1.2～114 μg/g.精密度试验结果表明,难于同时分析的碳、硅、锰、磷、硫的相对标准偏差(RSD,n＝11)分别为0.57%、1.3%、0.53%、0.98%、1.2%.方法用于生铁样品中10种元素的分析,测量结果与其他方法的分析结果相符.