首页> 外国专利> PROCESS FOR DETERMINING THICKNESS AND EVALUATING DEGRADATION OF LAYERS BY CORROBORATING X-RAY IMAGE ANALYSIS AND X-RAY FLUORESCENCE SPECTROSCOPY

PROCESS FOR DETERMINING THICKNESS AND EVALUATING DEGRADATION OF LAYERS BY CORROBORATING X-RAY IMAGE ANALYSIS AND X-RAY FLUORESCENCE SPECTROSCOPY

机译:X射线图像分析和X射线荧光光谱法测定层厚和评估层的降解过程

摘要

The invention relates to a process for determining thickness and evaluating the degradation of archaeological objects or objects of cultural patrimony, based on radiographs. According to the invention, the process is based on using two non-destructive techniques, namely: X-ray imagery and X-ray fluorescence spectroscopy, and the observation that the shades of grey obtained in radiographs are influenced by the acquisition parameters, the type of the investigated material and the thickness thereof, so that, by using fixed exposure parameters on samples of known composition, a correlation between the thickness of the sample and the value of the grey shade can be obtained. The claimed process consists of a stage of radiological exposures by using control samples of various thicknesses, to obtain calibration curves for various materials, at various thickness and acquisition parameters, followed by a stage of assigning a shade of grey to each thickness and of adding the calibration curves in a data base, after which radiographs of the object to be investigated are carried out, the object is elementarily characterized so as the material of which the object is made to be identified, followed by application of a calibration curve from the data base, selected depending on the material of which the object is made and on the acquisition parameters used, and information is obtained concerning the thickness and the degradation degree of layers by comparing the shades of grey from the radiograph with the shade from the calibration curve.
机译:本发明涉及一种基于射线照片确定厚度并评估考古对象或文化遗产对象的退化的方法。根据本发明,该过程基于使用两种非破坏性技术,即:X射线成像和X射线荧光光谱法,并且观察到射线照片中获得的灰色阴影受采集参数,类型的影响。因此,通过对已知成分的样品使用固定的曝光参数,可以得到样品厚度与灰度值之间的相关性。所要求保护的过程包括以下步骤:通过使用各种厚度的对照样品进行放射线照射,以获取各种材料在各种厚度和采集参数下的校准曲线,然后是为每种厚度分配灰色阴影并添加灰色阴影的步骤。数据库中的校准曲线,然后对要检查的对象进行射线照相,然后对对象进行基本表征,以便确定要识别的对象的材料,然后从数据库中应用校准曲线根据制造对象的材料和所使用的采集参数进行选择,然后通过比较射线照相中的灰色阴影和校准曲线中的阴影来获得有关层的厚度和降解程度的信息。

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