The indium in slag was determined by a portable energy dispersive X-ray fluorescence spectrometer using electric refrigerating Si-PIN semiconductor detector and 241 Am as excitation source.The effect of main matrix elements in sample including Fe, Cu, Pb and Zn was discussed. A mathematical model was established to correct the matrix effcct by combining special bulk ratio method and simple regression. The self-made sample was repeatedly determined using portable energy dispersive X-ray fluorescence spectrometer for 20 times. The measurement results showed that the standard deviation was 24. 5 μg/g and the relative standard deviation (RSD) was 6. 4%, so the instrument was under normal working conditions. The determination results of some self-made samples were compared with those obtained by chemical analysis method. The minimum relative error was 0. 35 % , and the measurement result of instrument was 0. 158 %. The maximum relative error was 26. 06 %, and the measurement result of instrument was 0. 023 %.%采用电致冷Si-PIN型半导体探测器和<'241>Am源作为激发源,以便携式能量色散X射线荧光快速分析仪为手段进行矿渣样品中铟的测定.讨论了样品中主要基体元素Fe、Cu、Pb、Zn等的影响,建立特散比法和一元回归相结合的数学模型对基体效应进行校正.仪器对自制样品重复测量20次,从测量结果分析来看,标准偏差为24.5μg/g,相对标准偏差为6.4%,仪器处于正常工作状态.通过部分自制样品的测量结果与化学分析的结果对比分析,相对误差的最小值为0.35%,仪器测量结果为0.158%;相对误差最大值为26.06%,仪器测量结果为0.023%.
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