红外焦平面探测器杜瓦组件真空寿命分析

摘要

The paper introduees accelerated life testing of integrated detector dewar assembly ( IDDA ). With this method,the vacuum life of long wave 576 × 6 HgCdTe IDDA is analyzed. The result indicates that the vacuum life of the product is longer than 10 years(95％ reliability) ,which satisfies the application requirement.%介绍了探测器杜瓦组件的加速寿命试验方法,对用于某机载红外热成像系统长波576 ×6 HgCdTe红外焦平面探测器组件的无维护真空寿命进行了分析,结果表明,产品真空寿命超过10年(可靠度为95%),满足产品应用要求.