红外焦平面读出电路成像重影问题的分析

摘要

With wide applications of infrared focal plane array(IRFPA)detector,there are some new problems in de-tector imaging.For double image phenomenon in 256 ×256 detector imaging,the corresponding imaging measurement method was presented.The relationship between double image and ROIC was analyzed from ROIC path,master clock frequency,target signal intensity,and so on,and the reason of double image was found out.%随着红外焦平面探测器广泛的应用,在实际成像中会出现一些新的问题.本文针对某款256×256规格的探测器成像出现重影问题,制定了相应的读出电路成像测试分析方案.从读出电路通道、主时钟频率、目标信号强度等方面全面分析该问题与读出电路的关系,并定位了重影问题的原因.