The leakage current parameter of the optocoupler was used to describe the object, which is described by the Wiener process. However, to use the Wiener process to describe the individual differences of different optocoupler leakage current degradation, as well as the processing of leakage current nonlinear data and the lack of clear failure thresholds are urgent problems to be solved. The linear Wiener process was improved, the random variable Arrhenius equation was established to randomize the drift coefficient, and the time-scale transformation formula was used to solve the problem of nonlinear data being converted into linear data. Finally, the parameters were estimated using a two-step maximum likelihood estimation. For the lack of a clear failure threshold, a swimming threshold was established to discuss reliability. The final evaluation of the optocoupler's t (0. 9) reliability in long-storage environments is 25. 4 to 27. 5 years.%以光耦的漏电流参数为刻画对象, 使用维纳过程对其进行描述.但使用维纳过程描述不同光耦漏电流退化的个体性差异, 以及漏电流非线性数据的处理以及明确失效阈值的缺乏, 是目前亟待解决的问题.对线性维纳过程进行了改进, 建立了随机变量阿伦尼乌斯方程, 以对漂移系数λ进行随机化处理, 其次利用时间-尺度变换公式解决了非线性数据转变为线性数据的问题, 最后使用两步极大似然估计对参数进行估计.针对缺乏明确失效阈值的问题, 设立了游动阈值对可靠度进行了讨论.最终评定在长储环境下光耦的t (0. 9) 为25. 4年至27. 5年.
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