Center for Instrumental Analysis;
University of Yamanashi;
Kofu;
Japan;
Center for Creative Technology;
University of Yamanashi;
Kofu;
Japan;
Center for Crystal Science and Technology;
University of Yamanashi;
Kofu;
Japan;
Strained; Si; SiGe(110); Stress-Induced; Twin; Transmission; Electron; Microscopy;