基于平板探测器DR升级方案中量子探测效率检测的应用

摘要

目的：探讨在基于平板探测器DR升级方案中量子探测效率(DQE)检测方法及其应用价值。方法：检测量子探测效率时，将入射X射线剂量与平板探测器产生的图像联系起来，根据国际电工委员会(IEC)制定的IEC 62220-1标准方法对刃钨模体图像进行分析，并结合平板探测器入射X射线空气比释动能的线性关系，利用DQEPro设备及软件计算得出3种不同类型平板探测器升级方案的DQE测试数据。结果：实验证明，通过DQE检测可明确了解DR升级方案中平板探测器的基本性能，DQE检测能反映不同类型的平板探测器的成像性能的优劣。结论：基于平板探测器的DR系统的升级方案中DQE检测，更好地为数字化X射线摄影系统计量性能检定提供技术依据，确保DR升级后在诊断中的成像质量。%Objective:To discuss the test methods and the application value of detective quantum efficiency (DQE) in upgrading of DR based on flat panel detector(FPD).Methods:Combining the dose of incident X-rays with the image brought by flat panel detector. According to the international electrotechnical commission IEC 62220-1 standard method, the tungsten imaging,and combined with the relationship between the FPD and incident X-ray air kerma, using DQEPro equipment and software to calculate the result of the three different types of FPD.Results: The experiment proves that the basic performance of flat panel detector is known definitely by testing the DQE. DQE can reflect the quality of imaging performance in different types of flat-panel detector.Conclusion: The upgrading of DR based on flat panel detector and the DQE testing can be a better technical basis for DR measurement performance, then it can be ensure the quality of DR upgraded in diagnostic imaging.