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GENERALIZED RAY TRACING, GENERALIZED BENDING, AND USE OF CAUSTIC SURFACES AS MERIT FUNCTIONS IN OPTICAL DESIGN.

机译:广义的射线跟踪,广义的弯曲以及在光学设计中使用腐蚀表面作为性能函数。

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摘要

Generalized ray tracing is an algorithm for calculating the geometrical parameters of a wavefront in the neighborhood of a traced ray. These calculations are applied, surface by surface, for each traced ray, to an optical system being designed. These calculations determine the two points of contact of each traced ray with the two sheets of caustic surface. The caustic surfaces are, in fact, aberrated three-dimensional images of object points and therefore contain all information on the geometrical aberrations of the subject lens. Caustic surfaces can be thought of as three-dimensional geometrical point spread functions. Generalized bending is a procedure by which the curvature of a pair of adjacent spherical refracting surfaces, their spearation, and the distance to the next succeeding or next preceding surface may be changed so that any paraxial ray is left invariant except between the two affected surfaces. In this study we discuss some characteristics of generalized bending and also show that the displacement of a caustic point caused by a generalized bending is in essentially a straight line, that the direction of the displacement is determined by which refracting surfaces are selected, and that the magnitude of the displacement is proportional to the logarithm of the bending parameter. This suggests that caustic surfaces can be used as a merit function in the optical process, that the merit functions can be calculated by means of generalized ray tracing, and that generalized bending provides an effective means of optimizing the design when included in a feedback loop.
机译:广义射线跟踪是一种用于计算被跟踪射线附近的波前的几何参数的算法。将这些计算逐条逐条应用于所设计的光学系统。这些计算确定了每个跟踪射线与两片苛性表面的两个接触点。实际上,苛性表面是物点的三维像,因此包含有关物镜几何像差的所有信息。苛性表面可以认为是三维几何点扩展函数。广义弯曲是一种过程,通过该过程可以更改一对相邻的球面折射曲面的曲率,它们的长矛以及与下一个后续或下一个先前曲面的距离,以使除了两个受影响的曲面之间的任何旁轴射线都保持不变。在这项研究中,我们讨论了广义弯曲的一些特征,并且还表明,由广义弯曲引起的苛性点的位移基本上是一条直线,位移的方向由选择折射面决定,并且位移的大小与弯曲参数的对数成正比。这表明苛性表面可以用作光学过程中的优值函数,可以通过广义射线跟踪来计算优函数,并且当包含在反馈回路中时,广义弯曲提供了一种优化设计的有效手段。

著录项

  • 作者

    CHANG, RONG SENG.;

  • 作者单位

    The University of Arizona.;

  • 授予单位 The University of Arizona.;
  • 学科 Physics Optics.
  • 学位 Ph.D.
  • 年度 1980
  • 页码 105 p.
  • 总页数 105
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 光学;
  • 关键词

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