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High efficiency vertical-cavity lasers using low-optical loss intra-cavity dielectric apertures.

机译:使用低光损耗腔内介电孔的高效垂直腔激光器。

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摘要

This dissertation leads to a greater understanding of vertical cavity laser (VCL) size scaling issues and performance limitations imposed by optical scattering loss, current leakage losses, and heating. This understanding is gained through a correlation of several different VCL measurements and device modeling, resulting in the identification of the key parameters to address in future structures.; The first measurements presented deconvolute the size dependent optical scattering losses and current leakage losses by measuring the differential efficiency as a function of size for etched-post and dielectrically apertured VCLs. These measurements show conclusively that the reduced optical scattering loss in dielectrically apertured lasers resulted in a dramatic improvement in device scaleability, efficiency, and threshold currents. This understanding led to the use of thin dielectric apertures to lower optical losses further, producing 2 {dollar}mu{dollar}m diameter VCLs that show only a 15% drop in differential efficiency compared to larger devices. With the losses measured, the currents lost to leakage around the active area, diffusion of carriers out of the active region, and non-radiative recombination were measured, showing that current spreading is the largest source of current loss.; Microwave measurements were also done on the low optical loss VCLs, showing the scaleability of the modulation frequency obtained through reduced optical scattering losses. A state-of-the-art 15.3 GHz at only 2.1 mA of drive current was measured. The saturation of the bandwidth at higher currents led to modeling of the effects of heating on the VCL performance. The modeling verifies the saturation of the bandwidth and points to the necessity of further reducing optical and carrier losses, but especially of eliminating unwanted series resistance if the ultimate bandwidth and efficiency performance is to be reached.
机译:本论文使人们对垂直腔激光器(VCL)尺寸缩放问题以及由光散射损耗,电流泄漏损耗和发热造成的性能限制有了更深入的了解。通过对几种不同的VCL测量值和器件建模之间的关联获得了这种理解,从而确定了未来结构中要解决的关键参数。通过测量作为刻蚀柱和介电孔径VCL的尺寸的函数,差分效率作为尺寸的函数,提出的第一个测量结果使与尺寸有关的光散射损耗和电流泄漏损耗解卷积。这些测量结果表明,介电孔径激光器中减小的光散射损耗导致器件的可缩放性,效率和阈值电流得到显着改善。这种理解导致使用薄的介电孔来进一步降低光学损耗,产生了直径为2μm的VCL,与较大的器件相比,VCL的差分效率仅下降了15%。通过测量损耗,可以测量到流失到有源区周围的电流,载流子从有源区扩散到非辐射复合以及无辐射复合的电流,这表明电流扩散是电流损耗的最大来源。还对低光损耗VCL进行了微波测量,显示了通过减少光散射损耗获得的调制频率的可缩放性。在仅2.1 mA的驱动电流下测量了最新的15.3 GHz。在较高电流下带宽的饱和导致对加热对VCL性能的影响进行建模。该模型验证了带宽的饱和度,并指出了进一步降低光学和载波损耗的必要性,但是如果要达到最终的带宽和效率性能,则尤其要消除不想要的串联电阻。

著录项

  • 作者

    Thibeault, Brian James.;

  • 作者单位

    University of California, Santa Barbara.;

  • 授予单位 University of California, Santa Barbara.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 1997
  • 页码 195 p.
  • 总页数 195
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

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