首页> 外文学位 >Chemistry at oxide surfaces: Reaction of water and HCl on alpha aluminum oxide(0001) and atomic layer deposition of tungsten.
【24h】

Chemistry at oxide surfaces: Reaction of water and HCl on alpha aluminum oxide(0001) and atomic layer deposition of tungsten.

机译:氧化物表面的化学性质:水和HCl在α氧化铝(0001)上的反应以及钨的原子层沉积。

获取原文
获取原文并翻译 | 示例

摘要

The adsorption and desorption of H2O and HCl on alpha-Al 2O3 (0001) were examined using laser induced thermal desorption (LITD) and temperature programmed desorption (TPD) techniques. The initial sticking coefficient for H2O on alpha-Al2O3 (0001) was ∼0.1 at 298 K. The HCl sticking coefficient on alpha-Al 2O3 (0001) was 10-3 at 298 K. For both H2O and HCl, the sticking coefficient decreases almost exponentially with coverage. The H2O and HCl desorption occurs over a broad temperature range of ∼300 K to 600 K. This broad range suggests a distribution of surface sites with different binding energies. The H2O and HCl desorption results versus coverage prepared by progressively annealing a fully exposed alpha-Al2O3 (0001) surface confirmed a wide range of binding energies. Additional TPD results showed that the H2 O and HCl randomly fill these sites independent of their adsorption energy. These results also suggest that surface diffusion between the adsorption sites must be negligible. Modeling of the H2O TPD data give a desorption energy range from 23--41 kcal/mol. The HCl model TPD data give a desorption energy range from 19--36 kcal/mol.;In addition to studying the H2O and HCl reactions on Al 2O3, the atomic layer deposition of tungsten was examined on Al2O3 and SiO2. The atomic layer deposition of tungsten can be achieved by separating the CVD reaction WF6 + Si2H6 → W + 2SiHF3 + 2H2 into two half-reactions. Successive application of the WF6 and Si2H6 half-reactions in an ABAB...sequence produces W atomic layer controlled growth. The nucleation and growth of W on SiO2 and Al2O 3 was examined using Auger electron spectroscopy. Auger electron spectroscopy studies at 473 K and 573 K reveal an initial nucleation phase that is followed by a layer-by-layer W growth regime. The Auger data is fit well assuming a Frank van der Merwe layer-by-layer growth. These studies reveal that the sequential surface reactions can facilitate metal wetting of oxide surfaces and conformal layer-by-layer metal growth.
机译:使用激光诱导热脱附(LITD)和程序升温脱附(TPD)技术检查了Al-Al 2O3(0001)上H2O和HCl的吸附和脱附。在298 K时,H2O在α-Al2O3(0001)上的初始黏附系数约为0.1。在298 K时,α-Al2O3(0001)上的HCl黏附系数为10-3。对于H2O和HCl而言,黏附系数均降低覆盖范围几乎成倍增长。 H2O和HCl的解吸发生在约300 K至600 K的宽温度范围内。该宽范围表明具有不同结合能的表面部位的分布。通过逐步退火完全暴露的α-Al2O3(0001)表面制备的H2O和HCl解吸结果与覆盖率的比较证实了广泛的结合能。 TPD的其他结果表明,H 2 O和HCl随机填充这些位点,而与它们的吸附能无关。这些结果还表明,吸附位点之间的表面扩散必须忽略不计。 H2O TPD数据的模型给出的解吸能量范围为23--41 kcal / mol。 HCl模型TPD数据给出的解吸能量范围为19--36 kcal / mol .;除了研究Al 2 O 3上的H 2 O和HCl反应外,还检查了Al 2 O 3和SiO 2上钨的原子层沉积。钨的原子层沉积可以通过将CVD反应WF6 + Si2H6→W + 2SiHF3 + 2H2分成两个半反应来实现。 WF6和Si2H6半反应在ABAB ...序列中的连续应用产生W原子层控制的生长。使用俄歇电子能谱法检查了W在SiO2和Al2O 3上的形核和生长。在473 K和573 K下进行的俄歇电子能谱研究显示出初始成核阶段,然后是逐层W生长机制。假设Frank van der Merwe逐层增长,则俄歇数据非常合适。这些研究表明,顺序的表面反应可以促进氧化物表面的金属润湿和共形的逐层金属生长。

著录项

  • 作者单位

    University of Colorado at Boulder.;

  • 授予单位 University of Colorado at Boulder.;
  • 学科 Chemistry Physical.;Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 1999
  • 页码 319 p.
  • 总页数 319
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-17 11:48:15

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号