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Dependence of transboundary current on facets along grain boundaries in YBCO thin films.

机译:跨界电流对YBCO薄膜中沿晶界的刻面的依赖性。

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摘要

Studies of the current carrying capability of grain boundaries in the High Temperature Superconductors have not only helped researchers to determine the pairing symmetry of the superconducting electrons, but also helped to improve the overall critical current density of the material. Previous work had found that transboundary current density depended only on the misorientation angle of the grain boundary and the current density decreased exponentially with increasing misorientation. However, the issue was complicated by the fact that electron pairings of High Temperature Superconductors had d-wave symmetry. Since the grain boundaries have tendency to meander and facet locally, it meant the matching of the lobes and nodes in the wavefunctions across the boundary interface locally would introduce an additional phase variation in the critical current density across the boundary. This additional phase variation was not previously considered because the HTS was at first thought to have s-wave pairing symmetry. Here, we attempt to quantify such effect both with a model and experiment by using non-faceted bicrystal grain boundaries with known inclinations. Experimentally, the Scanning SQUID microscope allows us to probe the local current density of a grain boundary without obscuration by the flux interacting with each other. In this case, the current density across the grain boundary can be determined by knowing the flux penetration length along the grain boundary. In our study, the variation in inclination is shown to be a second order effect. The misorientation angle still determines the coupling strength of the boundary.
机译:对高温超导体中晶界的载流能力的研究不仅有助于研究人员确定超导电子的配对对称性,而且还有助于提高材料的总体临界电流密度。先前的工作发现,跨界电流密度仅取决于晶界的取向差,并且电流密度随着取向差的增加而呈指数下降。然而,由于高温超导体的电子对具有d波对称性,这一问题变得复杂。由于晶界趋于局部弯曲和刻面,这意味着跨边界界面的波函数中的波瓣和波节的局部匹配将在跨边界的临界电流密度中引入额外的相位变化。以前没有考虑过这种额外的相位变化,因为最初认为HTS具有s波配对对称性。在这里,我们尝试通过使用已知倾角的非多面双晶晶界来通过模型和实验来量化这种效应。在实验上,Scanning SQUID显微镜使我们能够探查晶界的局部电流密度,而不会因通量相互作用而模糊不清。在这种情况下,可以通过了解沿晶界的磁通穿透长度来确定跨晶界的电流密度。在我们的研究中,倾斜度的变化显示为二阶效应。取向差角仍然确定边界的耦合强度。

著录项

  • 作者

    Tsai, Jack W. H.;

  • 作者单位

    Columbia University.;

  • 授予单位 Columbia University.;
  • 学科 Engineering Metallurgy.;Engineering Materials Science.
  • 学位 D.E.S.
  • 年度 2000
  • 页码 165 p.
  • 总页数 165
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 冶金工业;工程材料学;
  • 关键词

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