首页> 外文学位 >Poly-para-xylylene thin films: A study of the deposition chemistry, kinetics, film properties, and film stability.
【24h】

Poly-para-xylylene thin films: A study of the deposition chemistry, kinetics, film properties, and film stability.

机译:聚对二甲苯薄膜:沉积化学,动力学,薄膜性能和薄膜稳定性的研究。

获取原文
获取原文并翻译 | 示例

摘要

Poly-para-xylylene, or parylene, thin films are chemically vapor deposited (CVD), conformal, pin-hole free polymeric thin films. They have found many industrial uses since there invention in 1947 and continue to find new applications in micro-electronics, biotechnology, and micro-electro-mechanical systems. In this study the deposition chemistry, deposition kinetics, film properties, and film stability were investigated.; A differentially pumped quadrupole mass spectrometer was used to analyze the vapor species present during the CVD process. The identity of dimer contamination and its impact on the CVD process and film properties was studied. The quantitative conversion of dimer to monomer was investigated and it was found that conversion begins at around 385°C and by 565°C 100% conversion is obtained.; The kinetics of the CVD process was analyzed for a range of substrate temperatures and chamber pressures. A new kinetic model based on a two-step adsorption was developed and fit the kinetic data well. This model should be appropriate for use with all parylene family polymers.; Many of the properties of the films deposited in this study were analyzed. This includes a detailed study of surface morphology using atomic force microscopy which shows the interface width increases as a power law of film thickness. Other properties analyzed were the thermal stability, electrical properties, index of refraction, birefringence, hardness, and elastic modulus.; The effect of ultraviolet (UV) radiation of λ ≥ 250 nm on the thermal stability, electrical, and optical properties of thin parylene films was studied. The thermal stability and electrical properties of UV treated films were seen to deteriorate as the radiation dose increased.; The stability of parylene thin films receiving plasma etching was analyzed. The dielectric constant, dissipation factor, and leakage current of plasma etched thin parylene films were investigated and found to be stable for the range of chemistries and processing parameters investigated.
机译:聚对二甲苯或聚对二甲苯薄膜是化学气相沉积(CVD),保形,无针孔的聚合物薄膜。自1947年发明以来,他们已经发现了许多工业用途,并继续在微电子,生物技术和微机电系统中找到新的应用。在这项研究中,研究了沉积化学,沉积动力学,膜性能和膜稳定性。使用差分泵浦四极质谱仪分析CVD过程中存在的蒸气种类。研究了二聚物污染的鉴定及其对CVD工艺和膜性能的影响。研究了二聚体向单体的定量转化,发现转化在约385℃开始,到565℃时达到100%转化。针对衬底温度和腔室压力的范围分析了CVD工艺的动力学。建立了基于两步吸附的新动力学模型,并很好地拟合了动力学数据。该模型应适用于所有聚对二甲苯类聚合物。分析了这项研究中沉积的薄膜的许多特性。这包括使用原子力显微镜对表面形态进行的详细研究,该研究表明界面宽度随薄膜厚度的幂律而增加。分析的其他性能是热稳定性,电性能,折射率,双折射,硬度和弹性模量。研究了λ≥250 nm的紫外线(UV)对聚对二甲苯薄膜的热稳定性,电学和光学性质的影响。随着辐射剂量的增加,紫外线处理过的薄膜的热稳定性和电性能下降。分析接受等离子体蚀刻的聚对二甲苯薄膜的稳定性。研究了等离子体蚀刻的聚对二甲苯薄膜的介电常数,耗散因数和泄漏电流,发现在所研究的化学性质和工艺参数范围内是稳定的。

著录项

  • 作者

    Fortin, Jeffrey Bernard.;

  • 作者单位

    Rensselaer Polytechnic Institute.;

  • 授予单位 Rensselaer Polytechnic Institute.;
  • 学科 Engineering Materials Science.; Chemistry Polymer.
  • 学位 Ph.D.
  • 年度 2001
  • 页码 131 p.
  • 总页数 131
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;高分子化学(高聚物);
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号