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Transport, recombination and generation processes in high operating temperature mercury cadmium telluride/silicon structures.

机译:高温工作的碲化汞镉/硅结构中的运输,重组和生成过程。

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摘要

HgCdTe is the most widely used variable gap semiconductor material due to its fundamental properties and experimental flexibility. In spite of the successes achieved in the study of HgCdTe, many challenges still remain. A major one is to better understand and control the behavior of HgCdTe materials and heterostructures at elevated temperatures.; The results on the application of MBE technique to grow the high operating temperature (HOT) HgCdTe structures and the potential for near-room temperature operation of devices fabricated based on these structures are discussed in this thesis. Transport, recombination and generation processes are investigated in order to identify the parameters and mechanisms that limit the operation of these detectors at high temperatures, and also to propose possible solutions for increasing the operation temperature. Layer properties are analyzed from doping, scattering and recombination points of view. A dependence of the layer characteristics (minority carrier lifetime, mobility, trap energy and trap density) on the employed conditions is found. Dark current generating mechanisms are also investigated and a correlation with the material properties and with the theoretical models is established.; The heterostructure interfaces are studied to understand the mechanisms limiting the collection efficiency of the carriers and the current generation mechanisms. A combination of effects: non-equilibrium, heterostructure barrier formation, presence of Shockley-Read-Hall (SRH) centers are considered to explain the observed properties. To separate their influence, advances in controlled growth, processing and material quality are necessary. In spite of the encountered problems, HOT operation is demonstrated in terms of electrical characteristics, detectivity and spectral response.
机译:HgCdTe由于其基本特性和实验灵活性而成为使用最广泛的可变间隙半导体材料。尽管HgCdTe的研究取得了成功,但仍然存在许多挑战。一个主要的目的是更好地理解和控制HgCdTe材料和异质结构在高温下的行为。本文讨论了应用MBE技术生长高工作温度(HOT)HgCdTe结构的结果以及基于这些结构制造的器件在近室温下工作的潜力。为了确定限制这些探测器在高温下运行的参数和机理,还研究了运输,重组和生成过程,并提出了提高运行温度的可能解决方案。从掺杂,散射和复合的角度分析了层的性质。发现层特性(少数载流子寿命,迁移率,陷阱能和陷阱密度)与所采用的条件有关。还研究了暗电流产生机理,并建立了与材料特性和理论模型的相关性。研究异质结构界面以了解限制载流子收集效率的机理和电流产生机理。综合考虑以下因素:非平衡,异质结构势垒形成,Shockley-Read-Hall(SRH)中心的存在可以解释所观察到的特性。为了区分它们的影响,必须在可控的生长,加工和材料质量方面取得进步。尽管遇到了问题,但仍在电气特性,探测性和光谱响应方面证明了HOT操作。

著录项

  • 作者

    Velicu, Silviu N.;

  • 作者单位

    University of Illinois at Chicago.;

  • 授予单位 University of Illinois at Chicago.;
  • 学科 Physics Condensed Matter.; Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2002
  • 页码 95 p.
  • 总页数 95
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学 ;
  • 关键词

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