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Flexible, Ultra-Thin, Embedded Die Packaging.

机译:灵活的超薄嵌入式模具封装。

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摘要

As thin, flexible electronics solutions become more robust, their integration into everyday life becomes more likely. With possible applications in wearable electronics, biomedical sensors, or 'peel and stick' sensors, the reliability of these ultra-thin packages becomes paramount. Likewise, the density achievable with stacked packages benefits greatly from thinner die stacks. To this end, techniques previously developed have demonstrated packages with die thinned to approximately 20mum.;Covered in this work are methods for thinning and packaging silicon die, as well as information on common materials used in these processes. The author's contribution is a fabrication process for embedding ultra-thin (approximately 10mum) silicon die in polyimide substrates. This method is fully illustrated in Chapter 3 and enumerated in the Appendix as a quick reference.;Additionally, thermal cycle testing of passive daisy chain assemblies has shown promising reliability data. Packages were mounted in three alignments: flat, concave, and convex, and placed into thermal shock testing. Finally, the author discusses possible applications for this fabrication process, including the fabrication of multi-chip-modules.
机译:随着薄型,灵活的电子解决方案变得更加强大,它们越来越有可能融入日常生活。随着在可穿戴电子设备,生物医学传感器或“剥离和粘贴”传感器中的可能应用,这些超薄包装的可靠性变得至关重要。同样,堆叠封装可实现的密度大大受益于更薄的裸片堆叠。为此,先前开发的技术已经证明了将芯片减薄到大约20μm的封装。在这项工作中涉及的是减薄和封装硅芯片的方法,以及有关这些工艺中使用的常用材料的信息。作者的贡献是将超薄(约10微米)硅芯片嵌入聚酰亚胺衬底的制造工艺。此方法在第3章中进行了详细说明,并在附录中作为快速参考进行了列举。此外,无源菊花链组件的热循环测试显示出令人鼓舞的可靠性数据。包装以三种排列方式安装:平面,凹入和凸出,并置于热冲击测试中。最后,作者讨论了该制造工艺的可能应用,包括制造多芯片模块。

著录项

  • 作者

    McPherson, Ryan J.;

  • 作者单位

    Auburn University.;

  • 授予单位 Auburn University.;
  • 学科 Aeronomy.;Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2010
  • 页码 106 p.
  • 总页数 106
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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