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MOCVD Growth and Characterization of n-type Zinc Oxide Thin Films.

机译:MOCVD生长和n型氧化锌薄膜的特性。

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摘要

In the past decade, there has been widespread effort in the development of zinc oxide as a II-V1 semiconductor material. ZnO has potential advantages in optoelectronip device applications due to its unique electrical and optical properties. What stands out among these properties is its wide direct bandgap of 3.37 eV and its high electrical conductivity and transparency in the visible and near-UV regions of the spectrum. ZnO can be grown heteroepitaxially on GaN under near lattice-matched conditions and homoepitaxially as well, as high-quality bulk ZnO substrates are commercially available. This dissertation focuses on the development of the growth of high-quality, single crystal n-type ZnO films, control of n-type conductivity, as well as its application as a transparent contact material in GaN-based devices.;The first part of this dissertation is an extensive heteroepitaxial and homoepitaxial growth study presenting the properties of ZnO(0001) layers grown on GaN(0001) templates and ZnO(0001) substrates. We show that deposition on GaN requires a two-step growth technique involving the growth of a low temperature nucleation layer before growing a high temperature epitaxial layer in order to obtain smooth ZnO films with excellent crystal quality and step-flow surface morphology. We obtained homoepitaxial ZnO(0001) films of structural quality and surface morphology that is comparable to the as-received substrates, and showed that a high growth temperature (≥1000°C) is needed in order to achieve step-flow growth mode.;We performed n-type doping experiments, and established the conditions for which Indium effectively controls the n-type conductivity of ZnO films grown on GaN(0001) templates. A peak carrier concentration of 3.22x 10 19cm-3 and minimum sheet resistance of 97 O/square was achieved, while simultaneously maintaining good morphology and crystal quality.;Finally, we present In-doped ZnO films implemented as p-contacts for GaN-based solar cells and LEDs, and we investigate the n-ZnO/p-GaN interface. We show that ZnO has potential as an effective p-contact for these devices, and determine properties that still need improvement in order for ZnO to compete with other contact materials. We also compare the device performance to metal-contacted devices.;In summary, this thesis describes the growth of ZnO(0001) films by MOCVD, the progress in developing ZnO material with excellent surface morphology, high crystal quality, and controllable n-type doping, as well as its application to GaN-based optoelectronic devices as a p-contact material.
机译:在过去的十年中,在开发氧化锌作为II-V1半导体材料方面进行了广泛的努力。由于其独特的电学和光学特性,ZnO在光电夹持设备应用中具有潜在的优势。在这些特性中脱颖而出的是其3.37 eV的宽直接带隙以及在光谱的可见光和近紫外区域具有高电导率和透明度。 ZnO可以在接近晶格匹配的条件下在GaN上异质外延生长,并且也可以同质外延生长,因为高质量的块状ZnO衬底是可商购的。本文主要研究高质量单晶n型ZnO薄膜的生长,n型电导率的控制及其在GaN基器件中作为透明接触材料的应用。本论文是一项广泛的异质外延和同质外延生长研究,展示了在GaN(0001)模板和ZnO(0001)衬底上生长的ZnO(0001)层的特性。我们表明,在GaN上进行沉积需要两步生长技术,其中包括在生长高温外延层之前先生长低温成核层的技术,以获得具有出色晶体质量和阶梯流表面形貌的光滑ZnO膜。我们获得了结构质量和表面形貌可与原样相媲美的同质外延ZnO(0001)膜,表明需要高生长温度(≥1000°C)才能实现分步生长模式。我们进行了n型掺杂实验,并确定了铟有效控制在GaN(0001)模板上生长的ZnO薄膜的n型电导率的条件。实现了峰值载流子浓度3.22x 10 19cm-3和最小薄层电阻97 O / square,同时保持了良好的形貌和晶体质量。最后,我们介绍了In-掺杂的ZnO薄膜,该薄膜用作GaN-的p-接触。太阳能电池和LED,我们研究了n-ZnO / p-GaN界面。我们证明了ZnO具有作为这些器件的有效p接触的潜力,并确定了仍需改进才能使ZnO与其他接触材料竞争的性能。综上所述,本文介绍了MOCVD法生长ZnO(0001)薄膜,表面形貌优良,晶体质量高,n型可控的ZnO材料的研究进展。掺杂及其作为p接触材料在GaN基光电器件中的应用。

著录项

  • 作者

    Ben-Yaacov, Tammy.;

  • 作者单位

    University of California, Santa Barbara.;

  • 授予单位 University of California, Santa Barbara.;
  • 学科 Engineering Electronics and Electrical.;Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2010
  • 页码 118 p.
  • 总页数 118
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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