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QUANTITATIVE ANALYSIS OF THE TRACE ELEMENTS IN PURITY INDIUM MATERIAL BY GLOW DISCHARGE MASS SPECTROMETER

机译:辉光放电质谱仪对纯铟材料中微量元素的定量分析

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In this study, the analysis method of trace element in pure indium using glow discharge mass spectrometry (GD-MS) has been established by correcting the analysis result, which was obtained from non-standard quantitative method of GD-MS. The effect of instrument operating parameters, the resolution and isotopes and the pre-sputtering time on the determination results were investigated respectively. The optimized operating parameters of the instrument were obtained as follows: the discharge current was 37.5mA and discharge airflow was 475ml/min. Mass spectral interferences have been eliminated using selected resolution and isotope. The pre-sputtering time was 30 min. 4 trace elements in two pure samples were determined for 6 times. The RSD were less than 20%. The content of trace elements in indium samples was determined by GD-MS and Chemical Analysis Method of Indium which is tested by inductively coupled plasma atomic emission spectrometry, respectively. The results were consistent with each other.
机译:本研究通过校正分析结果,建立了用辉光放电质谱法(GD-MS)分析纯铟中痕量元素的方法,该方法是从GD-MS的非标准定量方法获得的。分别研究了仪器操作参数,分离度和同位素以及预溅射时间对测定结果的影响。仪器的最佳操作参数如下:放电电流为37.5mA,放电气流为475ml / min。使用选定的分辨率和同位素可以消除质谱干扰。预溅射时间为30分钟。测定两次纯样品中的4种微量元素,共6次。 RSD小于20%。铟样品中痕量元素的含量分别通过GD-MS和铟化学分析方法测定,分别通过电感耦合等离子体原子发射光谱法进行测试。结果彼此一致。

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