首页> 外文会议>The Third SANKEN international symposium on advanced nanoelectronics : Devices, materials, and computing >In_(0.53)Ga_(0.47)As/GaAs_(1-x)Sb_x type II strained MQW structures grown on InP by molecular beam epitaxy
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In_(0.53)Ga_(0.47)As/GaAs_(1-x)Sb_x type II strained MQW structures grown on InP by molecular beam epitaxy

机译:通过分子束外延在InP上生长的In_(0.53)Ga_(0.47)As / GaAs_(1-x)Sb_x II型应变MQW结构

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摘要

An In_(0.53)Ga_(0.47)As/Ga/As_(0.5)Sb_(0.5) type II quantum well structure on InP substrates is very attactive material system for infrared light emitting diodes and lassers in the 2 #mu# m wavelength region [1, 2]. Introduction of the strained structure gives superior performance as well as longer wavelength operation. This paper reports the molecular beam epitaxial (MBE) growth and characterization of In_(0.53)Ga_(0.47)As/GaAs_(1-x)Sb_x type II strained multiple quantum well (MQW) structures.
机译:InP衬底上的In_(0.53)Ga_(0.47)As / Ga / As_(0.5)Sb_(0.5)II型量子阱结构是用于2#mu#m波长区域中的红外发光二极管和激光的非常吸引人的材料系统[1,2]。引入应变结构可提供出色的性能以及更长的波长操作。本文报道了分子束外延(MBE)的生长和In_(0.53)Ga_(0.47)As / GaAs_(1-x)Sb_x II型应变多量子阱(MQW)结构的表征。

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