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Polarity control of ammonia-MBE grown GaN{0001} film

机译:氨MBE生长的GaN {0001}薄膜的极性控制

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Epitaxial wurtzite GaN{0001}, which is a promisining material for optoelectronic, high-temperature and high-power device applications, has a polar structure whose c axis is parallel to the growth direction (Fig.1). In the wurtzite GaN films, lattice polarity is one of the key issues which affect the optical and electrical properties of grown films[1-3]. In metalorganic chemical vapor deposition (MOCVD), there are many reports about the polarities of grown films [4] and high quality films are revealed to have Ga-face. however, in molecular beam epitaxy (MBE), there are only few reports about the plarities of heteroepitaxial GaN films.[5, 6] Regarding the plasma-assisted MBE films, the polarity is assumed to be N-Face, which is inferior to Ga-face in quality, though the growth parameters which determine the polarities of the films are not so clear.
机译:外延纤锌矿GaN {0001}是光电子,高温和高功率器件应用中的一种有前途的材料,其极性结构的c轴与生长方向平行(图1)。在纤锌矿GaN薄膜中,晶格极性是影响生长薄膜的光学和电学性质的关键问题之一[1-3]。在金属有机化学气相沉积(MOCVD)中,有许多关于生长膜的极性的报道[4],并且高质量的膜显示具有Ga面。然而,在分子束外延(MBE)中,关于异质外延GaN膜的整体性的报道很少。[5,6]关于等离子体辅助MBE膜,假定极性为N-Face,不如尽管决定薄膜极性的生长参数尚不十分清楚,但质量方面仍为Ga面。

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