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Spatial and temporal temperature variations in CMOS designs

机译:CMOS设计中的时空温度变化

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Due to the rapid growth in the number of transistors per chip, the power consumption of the average nMOS ASIC reached the level of one Watt, which is, in order of magnitude, about the maximum power consumption allowed for a cheap plastic package without thermal enhancements like drop-in heat spreader, fused leads or exposed pads. The internal chip temperature is the result of the combination of the chip power, the package, a possible heatsink, the application board and the airflow conditions. This requires a reasonably accurate model that includes the thermal properties of the chip, the bonds, the package and the system.
机译:由于每个芯片中晶体管数量的快速增长,平均nMOS ASIC的功耗达到了1瓦特的水平,这在数量级上大约是不带热增强功能的廉价塑料封装所允许的最大功耗。例如嵌入式散热器,保险丝或裸露的焊盘。内部芯片温度是芯片功率,封装,可能的散热器,应用板和气流条件共同作用的结果。这需要一个合理准确的模型,其中应包括芯片,键合,封装和系统的热性能。

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