Study on the Propagating Velocities of Reaction Waves in Al/Ti Multilayer Films

摘要

Al/Ti multilayer films were magnetron sputtered onto Mylar substrates. The propagating velocities of reaction waves in Al/Ti multilayer films were measured using high speed camera. Additionally, the propagating velocities were mathematically modeled. Results show that there’s a critical layer thickness and the critical layer thickness is around 25 nm. Furthermore, two regimes exist with respect to the layer thicknesses; in regime I (δ<δcr), the combustion is reaction-controlled, while in regime II (δ>δcr), combustion is diffusion-controlled.