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Smooth GaN surfaces by photoinduced electro-chemical etching

机译:通过光致电化学蚀刻使GaN表面光滑

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摘要

We have etched n-GaN grown both by plasma assisted MBE and MOCVD in 0.5 M KOH under HeCd-laser illumination (110 mW cm~(-2)) and controlled the photocurrent by an external voltage source. The reproducible etch depths were linear with respect to the charge. The examination of the dissolution potential revealed strong dependence on illumination and current. Thereby, regimes to obtain smoothly etched surfaces were found at low dissolution potentials. Demonstration of the possibilities in photoelectrochemical (PEC) etching are given.
机译:我们在HeCd激光照射下(110 mW cm〜(-2))在0.5 M KOH中蚀刻了通过等离子体辅助MBE和MOCVD生长的n-GaN,并通过外部电压源控制了光电流。可再现的蚀刻深度相对于电荷是线性的。溶解电位的检查显示强烈依赖于照明和电流。因此,发现在低溶解电位下获得光滑蚀刻表面的方案。给出了光电化学(PEC)蚀刻的可能性的证明。

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