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First-Principles Study of Oxygen Vacancy and Hydrogen Impurity Effects in the Pseudo-hexagonal Ta_2O_5

机译:伪六边形Ta_2O_5中氧空位和氢杂质效应的第一性原理研究

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The structures and electronic properties of Ta_2O_5 polymorphs were calculated using density-functional theory employing the generalized gradient approximation with on-site Coulomb corrections. Using this approach, a pseudo-hexagonal structure was found to be a stable polymorph of Ta_2O_5 over the δ- and β-Ta_2O_5 and is proposed as a new candidate structure which might be formed during the resistive switching process in random access memory devices. Its diffraction spectrum is shown to successfully match the recently indexed experimental structure and its band-gap energy is also in good agreement with available experimental data. A neutral oxygen vacancy is shown to induce an occupied defect state at 2.5 eV above the top of the valence band, as also found by x-ray photoelectron spectroscopy spectrum measurement. Furthermore, the effects of the hydrogen impurity on the electronic structures were investigated.
机译:Ta_2O_5多晶型物的结构和电子性质使用密度泛函理论计算,该理论使用广义梯度近似和现场库仑校正。使用这种方法,发现伪六边形结构是Ta_2O_5在δ-和β-Ta_2O_5上的稳定多晶型,并被建议作为可能在随机存取存储器件的电阻切换过程中形成的新候选结构。已证明其衍射光谱成功匹配了最近索引的实验结构,其带隙能量也与现有实验数据高度吻合。 X射线光电子能谱光谱测量也显示,中性氧空位在价带顶部上方2.5 eV处诱发了占据的缺陷状态。此外,研究了氢杂质对电子结构的影响。

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