首页> 外文会议>Symposium on Nanoparticulate Materials, Nov 26-29, 2001, Boston, Massachusetts, U.S.A. >Control of Nucleation to Realize High Density Si Nanoparticles on SiO_2 Thin Films
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Control of Nucleation to Realize High Density Si Nanoparticles on SiO_2 Thin Films

机译:控制成核以在SiO_2薄膜上实现高密度Si纳米颗粒

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摘要

A non-thermal method to facilitate nucleation for subsequent thermal chemical vapor deposition of Si nanoparticles on SiO_2/Si(001) with high density and uniform size is demonstrated. Submonolayers of Si adatoms are predeposited on SiO_2/Si(001) substrates by hotwire chemical vapor deposition with disilane in an UHV chamber. The nanoparticles are grown with a disilane pressure of 1x10~(-4) Torr at 550癈. The Si nanoparticles density is increased and size distribution is narrowed by predeposition of Si adatoms when compared to thermal growth on bare SiO_2/Si(001). The nanoparticles density can be controlled by the amount of Si adatom predeposition. 1.2xl0~(12) cm~(-2) density and 5.5 nm size are demonstrated on SiO_2/Si(001) under UHV-CVD conditions.
机译:证明了一种非成核方法,该成核方法有利于随后以高密度和均一尺寸在SiO_2 / Si(001)上进行Si纳米粒子的热化学气相沉积。通过在UHV室中用乙硅烷进行热线化学气相沉积,将Si原子的亚单分子层预沉积在SiO_2 / Si(001)衬底上。纳米颗粒在550癈下以1x10〜(-4)Torr的乙硅烷压力生长。与在裸露的SiO_2 / Si(001)上进行热生长相比,通过硅原子的预先沉积,硅纳米颗粒的密度增加,尺寸分布变窄。纳米粒子的密度可以通过硅原子预先沉积的数量来控制。在UHV-CVD条件下,在SiO_2 / Si(001)上显示出1.2x10〜(12)cm〜(-2)的密度和5.5 nm的尺寸。

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