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Microdiffraction Experiments and Modeling for Analyzing Multiscale Dislocation Ensembles in Materials

机译:材料中多尺度位错集合的微衍射实验和建模

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摘要

The intensity distribution of Laue diffraction is analyzed as a function of local misorientation. We show how unpaired dislocations alter the white beam Laue patterns for isolated dislocations, for dislocation walls, and for a combination of both. We consider the effect of different statistically and geometrically necessary dislocation densities on the intensity distribution along and perpendicular to the Laue streak. A 3D x-ray crystal microscope is used to analyze the complicated plastic-elastic field in a grain of a Ni polycrystalline sample during in-situ uniaxial pulling. A change of dislocation activity with depth is demonstrated. The dislocation slip systems and their densities are determined at various depths. The model parameters are used to simulate the whole Laue pattern including details about the contours for specific Laue spots; good agreement is found between simulated and experimental contours.
机译:Laue衍射的强度分布作为局部取向错误的函数进行了分析。我们展示了不成对的位错如何改变白光劳厄模式的孤立位错,位错壁以及两者的组合。我们考虑了不同的统计和几何上必要的位错密度对沿和垂直于劳厄条纹的强度分布的影响。使用3D X射线晶体显微镜分析原位单轴拉伸过程中镍多晶样品晶粒中复杂的塑性弹性场。演示了位错活动随深度的变化。位错滑移系统及其密度是在不同深度确定的。模型参数用于模拟整个Laue模式,包括有关特定Laue点轮廓的详细信息;在模拟轮廓和实验轮廓之间找到了很好的一致性。

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