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Magnetic anisotropy and growth texture in Co_35Pd_65 films

机译:Co_35Pd_65薄膜的磁各向异性和生长织构

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摘要

Pd-rich Co-Pd alloy films are well known to exhibit perpendicular anisotropy. In this study, Co_35Pd_65 films were made by the vapor deposition method. The thickness of the films ranged from 80 to 2000 A. following measurements were carried out on each film sample; the impurities and alloy compositions were checked by Auger depth profile analysis (AES), the surface topology was mapped out by an atomic force microscope (AEM), the structural analysis was done by using the X-ray diffractometer (XRD), and the magnetic properties, such as magnetic anisotropy and saturation magnetization, were measured by a SQUID magnetometer and/or a MOKE (using the longitudinal or polar effect) apparatus. Magnetic quantities, such as the out-of-plane (either hard or easy axis) squareness ratio M_r/M_s, saturation magnetization M_s, and anisotropy energy K_u, are closely relate to the structural properties, such as the degree of (111) texture, grain size D, mode of growth (nucleation texture or growth texture), and impurities in films. The emphasis is placed on the thickness dependence of these quantities, and the interrelationship among them.
机译:众所周知,富含Pd的Co-Pd合金膜表现出垂直各向异性。在这项研究中,Co_35Pd_65薄膜是通过气相沉积法制成的。膜的厚度范围为80至2000A。通过俄歇深度轮廓分析(AES)检查杂质和合金成分,通过原子力显微镜(AEM)绘制表面拓扑图,使用X射线衍射仪(XRD)进行结构分析,并通过磁力通过SQUID磁力计和/或MOKE(使用纵向或极化效应)设备测量磁各向异性和饱和磁化强度等特性。平面外(垂直轴或垂直轴)矩形比M_r / M_s,饱和磁化强度M_s和各向异性能K_u等磁性量与结构特性(例如织构度(111))密切相关。 ,晶粒尺寸D,生长方式(成核织构或生长织构)和薄膜中的杂质。重点放在这些量的厚度依赖性以及它们之间的相互关系上。

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