首页> 外文会议>Symposium on GaN and Related Alloys 2003; 20031201-20031205; Boston,MA; US >Fabrication of Thermoelectric Devices Using AlInN and InON Films prepared by reactive radio-frequency sputtering
【24h】

Fabrication of Thermoelectric Devices Using AlInN and InON Films prepared by reactive radio-frequency sputtering

机译:使用反应性射频溅射制备的AlInN和InON膜制造热电器件

获取原文
获取原文并翻译 | 示例

摘要

We have studied the thermoelectric properties of AlInN and InON films prepared by reactive radio-frequency (RF) sputtering. We have fabricated thermoelectric devices which are composed of 20-pair nitride or oxynitride films with Chromel metal. For a AlInN device, the maximum output power was 7.6x10~(-7) W at ΔT= 257K, and for a InON device, that was 6.5x10~(-8) W at ΔT = 214K.
机译:我们研究了通过反应性射频(RF)溅射制备的AlInN和InON薄膜的热电性能。我们已经制造了热电器件,该器件由具有铬合金的20对氮化物或氧氮化物膜组成。对于AlInN器件,在ΔT= 257K时,最大输出功率为7.6x10〜(-7)W;对于InON器件,在ΔT= 214K时,最大输出功率为6.5x10〜(-8)W。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号