首页> 外文会议>Symposium on Gallium Nitride and Related Materials II April 1-4,1997,San Francisco,California,U.S.A. >Initial stages of mocvd growth of gallium nitride using a multi-step growth approach
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Initial stages of mocvd growth of gallium nitride using a multi-step growth approach

机译:使用多步生长方法Movvd生长氮化镓的初始阶段

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A multiplayer buffer layer approach to GaN growth has been developed in which the thermal desorption and mass transport of low temperature buffer layer are minimized by deposition of successive layers at increased temperatues.High quality GaN with featureless depositionof successive layers at increased temperatures.high quality GaN with featureless surface morphology has been grown on (0001) sapphire substrate by metalorganic chemical vapor deposition using this multilayer buffer layer approach.The lateral growth and coalescence of truncated 3D islands (TTls) nucleated on low temperature buffer layers at the initial stage of overlayer growth is affected by the thickness of the final buffer layer on which nucleation of TTls takes place. The effect of the thickness of this buffer layer on the quality of GaN is studied by using scanning electron microscopy, can der Pauw geometry Hall measurements and cathodoluminescence and an optimum value of 400 A is obtained.
机译:已经开发出一种用于GaN生长的多层缓冲层方法,其中通过在较高温度下沉积连续的层来最大程度地减少低温缓冲层的热脱附和质量传输。高质量GaN在较高温度下无特征地沉积连续层。使用多层缓冲层方法通过金属有机化学气相沉积法在(0001)蓝宝石衬底上生长了具有无特征表面形态的薄膜。在顶层生长初期,在低温缓冲层上成核的截短3D岛(TTls)的横向生长和聚结受最终缓冲层的厚度影响,在该缓冲层上发生TT1的成核。通过使用扫描电子显微镜,can der Pauw几何霍尔测量和阴极发光研究了该缓冲层厚度对GaN质量的影响,并获得了400 A的最佳值。

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