Connection between Structure and Electronic Properties in Epitaxial Magnetic Layers

摘要

This study explores the consequences of structure on the electronic properties of magnetic multilayers. Epitaxial layers of Co and Cu are grown on Cu(100) in a new deposition system that couples sputter-deposition with MBE and contains a wide range of characterization tools, including RHEED, LEED, and Kerr effect. This system can be coupled in situ to spin-polarized, angle-resolved photoemission and to resonant, magnetic X-ray scattering, both employing synchrotron radiation. The interface structure turns not to be critical in determining the coercivity and the presence of quantum well states, which determine oscillatory magnetic coupling.