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Temperature dependence of the 11H photoreflectance lineshape in an (001) In0.21Ga0.79As/GaAs single quantum well

机译:(001)In0.21Ga0.79As / GaAs单量子阱中11H光反射线形的温度依赖性

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Abstract: The photoreflectance lineshape of the 11H exciton peak in an In$- 0.21$/Ga$-0.79$/As/GaAs single quantum well was measured from 10 K to 500 K. In contrast to the GaAs/GaAlAs system our 10 K data exhibited no `wings' and can be fit equally well by the first- derivative of a Gaussian or Lorentzian profile. The former is probably relevant since the well material is an alloy. These results indicate that care must be taken in associating spectra without pronounced `wings' with the Lorentzian profile. The temperature dependence of the 11H linewidth, which has been fit to a Bose-Einstein expression, yields important information about the quality of the material and interface. The variation of the energy of 11H with temperature agrees with that of bulk material. !24
机译:摘要:在In $-0.21 $ / Ga $ -0.79 $ / As / GaAs单量子阱中,11H激子峰的光反射线形的测量范围为10 K至500K。与GaAs / GaAlAs系统相比,我们的10 K数据没有“翅膀”,并且可以由高斯或洛伦兹曲线的一阶导数拟合得很好。前者可能很重要,因为井的材料是合金。这些结果表明,在将没有明显“翅膀”的光谱与洛伦兹轮廓相关联时必须格外小心。符合Bose-Einstein表达式的11H线宽的温度依赖性产生了有关材料和界面质量的重要信息。 11H能量随温度的变化与散装材料的变化一致。 !24

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