首页> 外文会议>Silicon Materials―Processing, Characterization and Reliability >DIELECTRIC AND ROOM TEMPERATURE TUNABLE PROPERTIES OF Mg-DOPED Ba_(0.96) Ca_(0.04) Ti_(0.84)Zr_(0.16)O_3 THIN FILMS on Pt/MgO
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DIELECTRIC AND ROOM TEMPERATURE TUNABLE PROPERTIES OF Mg-DOPED Ba_(0.96) Ca_(0.04) Ti_(0.84)Zr_(0.16)O_3 THIN FILMS on Pt/MgO

机译:在Pt / MgO上掺杂Mg的Ba_(0.96)Ca_(0.04)Ti_(0.84)Zr_(0.16)O_3薄膜的介电和室温温度可调谐特性

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摘要

Mg- doped Bao.96 Ca_(0.04)Ti_(0.84) Zr_(0.16)O_3 (BCTZ) thin films were fabricated on Pt/MgO substrate by metallorganic decomposition method. The structures of the films were analyzed by x-ray diffraction. The electrical measurements were performed on metal-ferroelectric-metal capacitors with platinum as the top and bottom electrode. The dielectric properties were improved after the capacitors were post annealed at 700℃ in oxygen atmosphere for 30 min. A high dielectric constant of 504 and a dissipation factor of less than 4% was obtained at 1 MHz. The Pt/BCTZ/Pt/MgO capacitors exhibited high tunability of 55% at an applied field of 55 kV/cm.
机译:通过金属有机分解法在Pt / MgO衬底上制备了Mg掺杂的Bao.96 Ca_(0.04)Ti_(0.84)Zr_(0.16)O_3(BCTZ)薄膜。通过X射线衍射分析膜的结构。电气测量在以铂为顶部和底部电极的金属铁电金属电容器上进行。将电容器在氧气气氛中700℃下进行30分钟后退火后,介电性能得到改善。在1 MHz时可获得504的高介电常数和小于4%的损耗因子。 Pt / BCTZ / Pt / MgO电容器在55 kV / cm的施加电场下显示出55%的高可调性。

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