首页> 外国专利> DIELECTRIC THIN FILM FOR LOW-TEMPERATURE PROCESSING WITH EXCELLENT DIELECTRIC PROPERTIES AND FORMING AT LOW TEMPERATURE OF 350 DEG. CELSIUS OR LOWER AND A MANUFACTURING METHOD THEREOF

DIELECTRIC THIN FILM FOR LOW-TEMPERATURE PROCESSING WITH EXCELLENT DIELECTRIC PROPERTIES AND FORMING AT LOW TEMPERATURE OF 350 DEG. CELSIUS OR LOWER AND A MANUFACTURING METHOD THEREOF

机译:具有优异介电性能的低温加工用介电薄膜,在低温下可形成350度。小食或小食及其制造方法

摘要

PURPOSE: A dielectric thin film for low-temperature processing and a manufacturing method thereof are provided to have high dielectric constant and to lower dielectric loss and leakage current.;CONSTITUTION: A dielectric thin film for low-temperature processing has the following formula. The formula is as follows: TaxMg1-xO. In the formula, x indicates 0.082 = x = 0.89. The x of the general formula is 0.35 = x = 0.50 or 0.80 = x = 0.89. The dielectric thin film is deposited at the room temperature to 350 deg. Celsius. The dielectric thin film is heat-treated at the higher temperature than the deposit temperature after being deposited. The dielectric thin film is heat-treated at 300-380°C. A manufacturing method of the dielectric thin film comprises the following step: depositing the thin film with the composition of TaxMg1-xO at the deposition temperature of room temperature to 350 deg. Celsius.;COPYRIGHT KIPO 2013
机译:目的:提供一种用于低温加工的介电薄膜及其制造方法,以具有高介电常数并降低介电损耗和漏电流。;组成:用于低温加工的介电薄膜具有以下公式。公式如下:TaxMg1-xO。在公式中,x表示0.082 <= x <= 0.89。通式的x为0.35≤x≤0.50或0.80≤x≤0.89。电介质薄膜在室温至350度下沉积。摄氏温度在沉积之后,在比沉积温度更高的温度下对介电薄膜进行热处理。介电薄膜在300-380℃下热处理。电介质薄膜的制造方法包括以下步骤:在室温至350℃的沉积温度下沉积具有TaxMg1-xO组成的薄膜。摄氏温度; COPYRIGHT KIPO 2013

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