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Interactions of Indium, Arsenic and Carbon in Silicon Using the Pseudopotential Technique

机译:伪电位技术在硅中铟,砷和碳的相互作用

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Factors limiting the activation of indium in silicon are examined via the ab initio pseudopotential technique. The role of carbon in the enhancement/retardation of activation/diffusion respectively is clarified. It is found that (1) adjacent substitutional indium atoms are deactivated. Only second neighbour sites of indium are activated unlike the case of boron, where all substitutional sites remain activated. (2) Silicon self-interstitials deactivate indium by trapping them on substitutional sites. Carbon, on the other hand, traps such self-interstitials with higher binding energy and prevents them from deactivating indium. (3) Since both indium and carbon diffusion is interstitial mediated, carbon reduces indium diffusion on account of its higher binding energy with the self-interstitial. Moreover, the release of the carbon interstitial is more favourable than the release of the indium interstitial from a carbon-indium pair. Therefore, carbon minimises indium interstitial diffusion. (4) Arsenic enhances de-activation of indium by neutralisation and by strong binding on adjacent substitutional sites. Furthermore since the release of the indium interstitial is more favourable in comparison to the release of the arsenic interstitial from the indium-arsenic pair, indium diffusion is enhanced in the presence of arsenic.
机译:通过从头算假电位技术检查了限制硅中铟活化的因素。阐明了碳分别在激活/扩散的增强/延迟中的作用。发现(1)相邻的取代铟​​原子是失活的。与硼不同,只有第二相邻的铟位点被激活,而硼的所有取代位点均保持激活状态。 (2)硅自填隙物通过将铟俘获在取代位点上而使其失活。另一方面,碳以较高的结合能捕获此类自填隙,并阻止它们使铟失活。 (3)由于铟和碳的扩散都是通过间隙介导的,所以碳由于其与自间隙的较高结合能而减少了铟的扩散。而且,碳间隙的释放比铟间隙从碳-铟对的释放更有利。因此,碳使铟间隙扩散最小化。 (4)砷通过中和和在相邻取代位点上的牢固结合来增强铟的失活。此外,由于与从铟-砷对中释放砷间隙相比,铟间隙的释放更有利,因此在存在砷的情况下提高了铟的扩散。

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