The Use of Short and Wide X-ray Pulses for Time-of-Flight X-ray Compton Scatter Imaging in Cargo Security

摘要

Using a short pulse width x-ray source and measuring the time-of-flight of photons that scatter from an object under inspection allows forthe point of interaction to be determined, and a profile of the object to be sampled along the path of the beam. A three dimensional image can be formed by interrogating the entire object. Using high energy x rays enables the inspection of cargo containers with steel walls, in the search for concealed items. A longer pulse width x-ray source can also be used with deconvolution techniques to determine the points of interaction. We present time-of-flight results from both short (picosecond) width and long (hundreds of nanoseconds) width x-ray sources, and show that the position of scatter can be localised with a resolution of 2 ns, equivalent to 30 cm, for a 3 cm thick plastic test object.