TEXTURED POROUS SILICON FOR EFFICIENT LIGHT DETECTION IN UV, VIS AND NIR SPECTRUM RANGES

摘要

Advanced porous silicon (PS) based structures for a light detection in UV, VIS and NIR ranges are discussed. PS in light detectors is shown to enhance significantly the photoresponse and to decrease the reflectance of the structures promoting more efficient device operation. The surface of PS being highly texturized enhances light trapping and reduces reflection losses. Formation of the PS layer from pyramidal-film texture facilitate efficient light trapping. The tunability of the PS bandgap may be used to optimize the sunlight absorption.