ACCELERATED LIFE TESTS AND RELIABILITY IMPROVEMENT OF IMAGE INTENSIFIER ASSEMBLY(KIT-7)

摘要

The accelerated life tests(ALTs) and degradation characteristics of image intensifier assembly(KIT-7) under low illuminance and high temperature were investigated. In addition to that, reliability of image intensifier assembly was improved by revising the manufacturing process of image intensifier assembly. The accelerated life tests were carried out at 5 × 10~(-5) fc - 40 ℃, 10 × 10~(-5) fc - 40 ℃, 5 × 10~(-5) fc - 50 ℃, 10 × 10~(-5) fc - 50 ℃ and relationship related to illuminance and temperature was used as an accelerated life test model. An ALTA program[7] was used to caculate an acceleration factor and the test of life distribution fit, and estimate three parameters of a life test model. To improve the reliability of image intensifier assembly, ion barrior film was installed on micro channel plate(MCP).