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Effects of a measurement floor on Mueller matrix measurements in a DRR BSDF system

机译:DRR BSDF系统中测量平台对Mueller矩阵测量的影响

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Since the bidirectional scatter distribution function (BSDF) is proportional to the intensity of the scattered light, a BSDFsystem with the addition of a dual rotating retarder system can be used to calculate the Mueller matrix of a scatterer. Anadvantage of a BSDF system is the large dynamic range which allows the measurement of scattered light both near toand far from the specular region. In some cases as measurements move away from the specular and into the scatterregion, the measured signal decreases and the system reaches a measurement floor. Therefore, any BSDF and Muellermatrix measurements are dependent on the scatter from the sample and on the noise floor of the system. Since the noisefloor of an electro-optical system is near constant, the Mueller matrix measurement of the noise floor will be that of aperfect depolarizer. As the measurement space moves away from the high-signal region, the scattered signal decreasesand the floor of the system is approached so the Mueller matrix measurements can shift towards a perfect depolarizer.The rate and location of this shift will be dependent on how Lambertian the sample is and the ratio of signal to noise inthe system. Because of this tendency, caution must be taken when drawing conclusions about the Mueller matrix ofscattered light, particularly in the scatter measurement region where the measured signal approaches the system floor.© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
机译:由于双向散射分布函数(BSDF)与散射光的强度成比例,因此可以使用添加了双重旋转延迟器系统的BSDF系统来计算散射器的Mueller矩阵。 BSDF系统的优点是动态范围大,可以测量靠近和远离镜面反射区域的散射光。在某些情况下,随着测量远离镜面并进入散射区域,测量的信号会减小,并且系统到达测量平台。因此,任何BSDF和Muellermatrix测量都取决于样品的散射和系统的本底噪声。由于电光系统的本底噪声几乎恒定,因此本底噪声的Mueller矩阵测量将是完美的去偏振器。随着测量空间远离高信号区域,散射信号减小并且接近系统底限,因此Mueller矩阵测量可以朝着理想的去偏振器偏移。此偏移的速率和位置将取决于Lambertian样本是和系统中信噪比。由于这种趋势,在得出关于散射光的Mueller矩阵的结论时必须格外小心,尤其是在被测信号接近系统基底的散射测量区域中。©(2012)COPYRIGHT光电仪器工程师协会(SPIE)。摘要的下载仅允许个人使用。

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