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Method and apparatus for determining polarization-altering element parameters from full mueller matrix measurements

机译:从完整的穆勒矩阵测量确定偏振改变元素参数的方法和装置

摘要

Method and apparatus for testing of LCD cells is disclosed. An LCD cell under test (14, 30) may be mounted to translatable table (40) between polarization state generator (10) and polarization state analyzer (16). For each location on cell (14, 30) to be tested, a variety of known polarization states (22) are launched through LCD cell (14, 30) and detected by polarization state analyzer (16). Electrical signals representative of polarization states are acquired by computer (18). Within computer (18), a model (58, 60) of polarization properties of LCD cell (14, 30) is developed based on estimations of what physical parameters of LCD cell (14, 30) are believed to be. RMS differences between simulated polarization properties and measured polarization properties are minimized by iteratively refining (60) modeled physical cell properties, at which point cell thickness and other physical parameters of the LCD cell may be deduced.
机译:公开了用于测试LCD单元的方法和设备。可以在极化状态发生器( 10 )和极化状态之间将可测LCD单元( 14、30 )安装到可移动台( 40 )上分析器( 16 )。对于要测试的单元( 14,30 )上的每个位置,通过LCD单元( 14,30 < / B>),并由偏振态分析仪( 16 )进行检测。代表极化状态的电信号由计算机( 18 )获取。在计算机( 18 )内,基于估计,建立了LCD单元( 14、30 )极化特性的模型( 58、60 ) LCD单元( 14,30 )的物理参数是多少。通过迭代精炼( 60 )建模的物理单元特性,可以将模拟偏振特性和测量偏振特性之间的RMS差异最小化,此时可以推导出LCD单元的单元厚度和其他物理参数。

著录项

  • 公开/公告号US8325340B2

    专利类型

  • 公开/公告日2012-12-04

    原文格式PDF

  • 申请/专利权人 MATTHEW SMITH;

    申请/专利号US20060921744

  • 发明设计人 MATTHEW SMITH;

    申请日2006-06-09

  • 分类号G01J4;

  • 国家 US

  • 入库时间 2022-08-21 16:42:41

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