首页> 外国专利> METHOD AND APPARATUS FOR DETERMINING LIQUID CRYSTAL CELL PARAMETERS FROM FULL MUELLER MATRIX MEASUREMENTS

METHOD AND APPARATUS FOR DETERMINING LIQUID CRYSTAL CELL PARAMETERS FROM FULL MUELLER MATRIX MEASUREMENTS

机译:从全米勒矩阵测量确定液晶细胞参数的方法和装置

摘要

Method and apparatus for testing of LCD panels is disclosed. An LCD panel under test is mounted to a translatable table between a polarization state generator and polarization state analyzer. For each location on the screen to be tested, a continuum of known polarization states are launched through the LCD screen and detected by the polarization state analyzer. Electrical signals representative of such polarization states are acquired by a computer. Within the computer, a model of polarization properties of the LCD panel is developed based on estimations of what the physical parameters of the LCD panel are believed to be. RMS differences between simulated polarization properties and measured polarization properties are minimized by iteratively refining the modeled physical cell properties, at which point cell thickness and other physical parameters of the LCD screen may be deduced.
机译:公开了用于测试LCD面板的方法和设备。被测LCD面板安装在偏振态发生器和偏振态分析仪之间的可移动工作台上。对于要测试的屏幕上的每个位置,都会通过LCD屏幕发射已知偏振态的连续体,并由偏振态分析器进行检测。代表这种极化状态的电信号由计算机获取。在计算机内,基于对LCD面板物理参数的估计,开发了LCD面板的偏振特性模型。通过迭代地精炼建模的物理单元特性,可以将模拟偏振特性与测量偏振特性之间的RMS差异最小化,此时可以推导出LCD屏幕的单元厚度和其他物理参数。

著录项

  • 公开/公告号KR101301375B1

    专利类型

  • 公开/公告日2013-09-10

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20087000657

  • 发明设计人 스미스 매튜 에이치.;

    申请日2006-06-09

  • 分类号G01B11/16;G01B11;

  • 国家 KR

  • 入库时间 2022-08-21 16:24:36

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