gmTest: an industry-wide database of VLSI layouts for quality control

摘要

The need for a standardized library of test cases and VLSI layouts has become increasingly important as the EDA industry matures into the nanometer regime. No such library has ever been developed due to the intimidating scope of such an undertaking, and intellectual property (IP) concerns of potential contributors. In this paper we present a new database of layouts and test cases under development to meet this need. The gmTest database supports twenty-three classes of EDA operations, from aerial image simulation to file format translation, in a consistent and standardized manner. Additionally we present a novel "layout hashing" technology which allows generation of new, IP-free layouts from proprietary designs to duplicate error causing files for vendors without disclosing intellectual property. Using an intelligent generation system, a database of "almost-real" design patterns are created for general testing and debugging