Analysis and experimental results of an FPGA-based strategy for fast production test of high resolution ADCs

摘要

This work describes an intensive investigation on the test strategy known as polynomial fitting that uses FPGA generated stimuli for cheap and fast testing of high resolution ADCs. Simulation and experimental results showed sensitivity on the specifications parameters detection of 90 dB. The proposed method can also help to control the cost of ADC production test, extends the test coverage and enable built-in self-test and test-based self-calibration