首页> 外文会议>Proceedings of the Twenty-Third International Symposium on Compound Semiconductors held in St Petersburg, Russia, 23-27 September 1996 >Determination of valence-band offset of p-Al_xGa_(1-x)As/p-Al_xGa_(1-x)As-heterojunctions from C-V-measurements
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Determination of valence-band offset of p-Al_xGa_(1-x)As/p-Al_xGa_(1-x)As-heterojunctions from C-V-measurements

机译:从C-V测量确定p-Al_xGa_(1-x)As / p-Al_xGa_(1-x)As异质结的价带偏移

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摘要

The isotype heterojections p-Al_(0.2)Ga_(0.8)As/p-Al_(0.5)Ga_(0.5)As grown by MOVPE on n-GaAs substrates were investigated at the temperatures of 300, 200 and 150 K. For determination of valence-band discontinuity DELTA E_v and interface charge N_(ss) the Poisson equation was solved numerically on an adaptive nonunifom coordinate meash. An incomplete ionization of acceptors was taken into consideration. The DELTA E_v proved to be equal 113 meV (38
机译:在300、200和150 K的温度下研究了MOVPE在n-GaAs衬底上生长的同型异质注入p-Al_(0.2)Ga_(0.8)As / p-Al_(0.5)Ga_(0.5)As。价带不连续性DELTA E_v和界面电荷N_(ss)的Poisson方程在自适应非单调坐标网格上数值求解。考虑到受体的不完全电离。 DELTA E_v等于113 meV(38

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