CESIUM IODIDE AND SCHEELITE COUPLED X-RAY SENSORS CHARACTERIZATION FOR INDUSTRIAL APPLICATIONS OF COMPUTED TOMOGRAPHY (CT) AS NON DESTRUCTIVE TESTING (NDT)

摘要

Scintillating materials play vital role in characterization ofrnx-ray intensity sensors according to linearity andrnoperating range. In this study, Cesium iodide (CsI) andrnScheelite (CaWO4) coupled x-ray sensors arerncharacterized on the basis of varied x-ray tube voltage,rntube current and distance between x-ray source and sensorrnto conclude towards selection of efficient x-ray intensityrnsensor. These sensors are employed to measure the unattenuatedrn(primary) x-ray intensity generated byrnComputed Tomography (CT) machine. Speciallyrndeveloped x-ray Io device monitor is used to conduct testrnwith designed sensors. Various commercially availablernphotodiodes are coupled with Cesium Iodide andrnScheelite scintillating materials and connected to readoutrnunit to measure the upcoming x-ray intensity from CTrnmachine on a HyperTerminal Window. Characterizationrntest protocols depict x-ray sensors coupled with Scheeliternscintillation material provide more linearity and operatingrnrange for as compare to Cesium Iodide coupled one.