CESIUM IODIDE AND SCHEELITE COUPLED X-RAY SENSORS CHARACTERIZATION FOR INDUSTRIAL APPLICATIONS OF COMPUTED TOMOGRAPHY (CT) AS NON DESTRUCTIVE TESTING (NDT)

摘要

Scintillating materials play vital role in characterization of x-ray intensity sensors according to linearity and operating range. In this study, Cesium iodide (CsI) and Scheelite (CaWO4) coupled x-ray sensors are characterized on the basis of varied x-ray tube voltage, tube current and distance between x-ray source and sensor to conclude towards selection of efficient x-ray intensity sensor. These sensors are employed to measure the unattenuated (primary) x-ray intensity generated by Computed Tomography (CT) machine. Specially developed x-ray Io device monitor is used to conduct test with designed sensors. Various commercially available photodiodes are coupled with Cesium Iodide and Scheelite scintillating materials and connected to readout unit to measure the upcoming x-ray intensity from CT machine on a HyperTerminal Window. Characterization test protocols depict x-ray sensors coupled with Scheelite scintillation material provide more linearity and operating range for as compare to Cesium Iodide coupled one.