A double-slits interference method for phase modulation measurement in holographic display

摘要

In order to precisely measure the phase shifting for holographic display, a new spatial light modulator (SLM) characterization procedure is presented, based on the analysis of the interference fringes of double-slits interference. We identify the linear range of phase shift of the modulator by measuring both phase and intensity. Experimental results show that the 30-180 grey scales linear ranges of the phase shift which proves that it is a simple and reliable method to measure the characteristics of phase modulation.