RF Beam Chopping in a Surface-Plasma Type Negative Ion Source

摘要

A direct fast chopped beam extracted from a surface-plasma H~- ion source is proposed and a preliminary test has been examined. The converter bias voltage is modulated by rf pulses and the extracted H~- beam is observed. The direct fast chopped H~- beam extracted from the ion source has a good response to the modulation of the converter bias voltage as expected The chopped H~- beam extracted by this method has been injected into the 500 MeV booster synchrotron at KEK-PS.