Beyond polarization microscopy: Mueller matrix microscopy with frequency demodulation

摘要

Mueller matrix microscopy is the natural generalization of polarization microscopy. It provides images of the Mueller matrix of a sample with micrometric resolution. In this work we describe a Mueller matrix microscope that uses the dual rotating compensator technique to simultaneously determine all the elements of its transmission or reflection Mueller matrix. The instrument uses two compensators that rotate at different frequencies and every Mueller matrix element is determined by using a digital frequency demodulation technique that does the frequency-analysis of the time dependent intensity captured at every pixel of the CCD detector. Transmission and reflection measurements are illustrated with experimental examples.