Fourier ptychographic microscopy and Mueller matrix microscopy: differences and complementarity

摘要

As a light wave passes across a sample, it undergoes delays related to the optical path it has taken. The amount of delay is proportional to the product of the refractive index and the thickness of the sample. It can hardly be measured with conventional optical microscopy. Furthermore, the velocity of light in an optically anisotropic medium is polarization dependent. A phase difference between the components of the oscillating electric field may then be induced. It is quantified by retardance.Optical phase and polarimetric retardance are commonly used to examine biological tissues. This work investigates the complementarity of these physical quantities retrieved by two optical modalities, namely Fourier Ptychographic Microscopy and Mueller Matrix Microscopy. It is based on two microscopes we have constructed. Observations on histological slides will be presented for experimental validation.